Trifluorosilyl radical
- Formula: F3Si
- Molecular weight: 85.0807
- IUPAC Standard InChIKey: ATVLVRVBCRICNU-UHFFFAOYSA-N
- CAS Registry Number: 14835-14-4
- Chemical structure:
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Gas phase thermochemistry data
Go To: Top, Vibrational and/or electronic energy levels, References, Notes
Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.
Quantity | Value | Units | Method | Reference | Comment |
---|---|---|---|---|---|
ΔfH°gas | -1085.33 | kJ/mol | Review | Chase, 1998 | Data last reviewed in December, 1977 |
Quantity | Value | Units | Method | Reference | Comment |
S°gas,1 bar | 282.37 | J/mol*K | Review | Chase, 1998 | Data last reviewed in December, 1977 |
Gas Phase Heat Capacity (Shomate Equation)
Cp° = A + B*t + C*t2 + D*t3 +
E/t2
H° − H°298.15= A*t + B*t2/2 +
C*t3/3 + D*t4/4 − E/t + F − H
S° = A*ln(t) + B*t + C*t2/2 + D*t3/3 −
E/(2*t2) + G
Cp = heat capacity (J/mol*K)
H° = standard enthalpy (kJ/mol)
S° = standard entropy (J/mol*K)
t = temperature (K) / 1000.
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Temperature (K) | 298. to 1100. | 1100. to 6000. |
---|---|---|
A | 42.39647 | 82.72312 |
B | 97.32779 | 0.250286 |
C | -88.85937 | -0.054788 |
D | 28.86240 | 0.004184 |
E | -0.415787 | -3.587279 |
F | -1102.965 | -1120.312 |
G | 306.0182 | 366.7268 |
H | -1085.330 | -1085.330 |
Reference | Chase, 1998 | Chase, 1998 |
Comment | Data last reviewed in December, 1977 | Data last reviewed in December, 1977 |
Vibrational and/or electronic energy levels
Go To: Top, Gas phase thermochemistry data, References, Notes
Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.
Data compiled by: Marilyn E. Jacox
State: ?
Energy (cm-1) |
Med. | Transition | λmin (nm) |
λmax (nm) |
References | ||
---|---|---|---|---|---|---|---|
gas | 290 | 340 | Suto, Han, et al., 1989 | ||||
Biehl, Boyle, et al., 1997 | |||||||
State: ?
Energy (cm-1) |
Med. | Transition | λmin (nm) |
λmax (nm) |
References | ||
---|---|---|---|---|---|---|---|
gas | 350 | 800 | Donnelly and Flamm, 1980 | ||||
Suto, Han, et al., 1989 | |||||||
Vanhaelemeersch, Van Hoeymissen, et al., 1991 | |||||||
Biehl, Boyle, et al., 1997 | |||||||
State: X
Vib. sym. |
No. | Approximate type of mode |
cm-1 | Med. | Method | References | |
---|---|---|---|---|---|---|---|
a1 | 1 | SiF stretch | 834.9 | Ne | IR | Jacox, Irikura, et al., 1995 | |
1 | SiF stretch | 832 | s | Ar | IR | Milligan, Jacox, et al., 1968 | |
2 | Umbrella | 406 | s | Ar | IR | Milligan, Jacox, et al., 1968 | |
e | 3 | SiF stretch | 958.6 | Ne | IR | Jacox, Irikura, et al., 1995 | |
3 | SiF stretch | 954 | vs | Ar | IR | Milligan, Jacox, et al., 1968 | |
4 | Deformation | 290 | w m | Ar | IR | Milligan, Jacox, et al., 1968 | |
Additional references: Jacox, 1994, page 218; Jacox, 1998, page 262; Jacox, 2003, page 241; Wang, Krishnan, et al., 1973; Griffith and Mathews, 1997; Tanimoto and Saito, 1999
Notes
w | Weak |
m | Medium |
s | Strong |
vs | Very strong |
References
Go To: Top, Gas phase thermochemistry data, Vibrational and/or electronic energy levels, Notes
Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.
Chase, 1998
Chase, M.W., Jr.,
NIST-JANAF Themochemical Tables, Fourth Edition,
J. Phys. Chem. Ref. Data, Monograph 9, 1998, 1-1951. [all data]
Suto, Han, et al., 1989
Suto, M.; Han, J.C.; Lee, L.C.; Chuang, T.J.,
Emission spectra of SiF3,
J. Chem. Phys., 1989, 90, 5, 2834, https://doi.org/10.1063/1.455935
. [all data]
Biehl, Boyle, et al., 1997
Biehl, H.; Boyle, K.J.; Seccombe, D.P.; Smith, D.M.; Tuckett, R.P.; Yoxall, K.R.; Baumgartel, H.; Jochims, H.W.,
Vacuum-UV fluorescence spectroscopy of SiF[sub 4] in the range 10--30 eV,
J. Chem. Phys., 1997, 107, 3, 720, https://doi.org/10.1063/1.474437
. [all data]
Donnelly and Flamm, 1980
Donnelly, V.M.; Flamm, D.L.,
Studies of chemiluminescence accompanying fluorine atom etching of silicon,
J. Appl. Phys., 1980, 51, 10, 5273, https://doi.org/10.1063/1.327282
. [all data]
Vanhaelemeersch, Van Hoeymissen, et al., 1991
Vanhaelemeersch, S.; Van Hoeymissen, J.; Vermeylen, D.; Peeters, J.,
SiF2 as a primary desorption product of Si etching by F atoms: Interpretation of laser-induced fluorescence spectra; rate constant of the gas phase SiF2+F reaction,
J. Appl. Phys., 1991, 70, 7, 3892, https://doi.org/10.1063/1.349197
. [all data]
Jacox, Irikura, et al., 1995
Jacox, M.E.; Irikura, K.K.; Thompson, W.E.,
Matrix isolation study of the interaction of excited neon atoms with SiF4: Infrared spectra of SiF+3 and SiF-3,
J. Chem. Phys., 1995, 103, 13, 5308, https://doi.org/10.1063/1.470726
. [all data]
Milligan, Jacox, et al., 1968
Milligan, D.E.; Jacox, M.E.; Guillory, W.A.,
Matrix-Isolation Study of the Vacuum-Ultraviolet Photolysis of Trifluorosilane. The Infrared Spectrum of the Free Radical SiF3,
J. Chem. Phys., 1968, 49, 12, 5330, https://doi.org/10.1063/1.1670052
. [all data]
Jacox, 1994
Jacox, M.E.,
Vibrational and electronic energy levels of polyatomic transient molecules, American Chemical Society, Washington, DC, 1994, 464. [all data]
Jacox, 1998
Jacox, M.E.,
Vibrational and electronic energy levels of polyatomic transient molecules: supplement A,
J. Phys. Chem. Ref. Data, 1998, 27, 2, 115-393, https://doi.org/10.1063/1.556017
. [all data]
Jacox, 2003
Jacox, M.E.,
Vibrational and electronic energy levels of polyatomic transient molecules: supplement B,
J. Phys. Chem. Ref. Data, 2003, 32, 1, 1-441, https://doi.org/10.1063/1.1497629
. [all data]
Wang, Krishnan, et al., 1973
Wang, J.L.-F.; Krishnan, C.N.; Margrave, J.L.,
Emission spectrum of SiF3,
J. Mol. Spectrosc., 1973, 48, 2, 346, https://doi.org/10.1016/0022-2852(73)90199-9
. [all data]
Griffith and Mathews, 1997
Griffith, W.B., Jr.; Mathews, C.W.,
private communication., 1997, https://doi.org/10.1016/S1090-9516(97)90007-9
. [all data]
Tanimoto and Saito, 1999
Tanimoto, M.; Saito, S.,
Microwave spectroscopic study of the SiF[sub 3] radical: Spin-rotation interaction and molecular structure,
J. Chem. Phys., 1999, 111, 20, 9242, https://doi.org/10.1063/1.479838
. [all data]
Notes
Go To: Top, Gas phase thermochemistry data, Vibrational and/or electronic energy levels, References
- Symbols used in this document:
S°gas,1 bar Entropy of gas at standard conditions (1 bar) ΔfH°gas Enthalpy of formation of gas at standard conditions - Data from NIST Standard Reference Database 69: NIST Chemistry WebBook
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