Tetraethyl silicate

• Formula: C₈H₂₀O₄Si
• Molecular weight: 208.3275
• IUPAC Standard InChI: InChI=1S/C8H20O4Si/c1-5-9-13(10-6-2,11-7-3)12-8-4/h5-8H2,1-4H3 Copy

  
• IUPAC Standard InChIKey: BOTDANWDWHJENH-UHFFFAOYSA-N Copy
• CAS Registry Number: 78-10-4
• Chemical structure:
  This structure is also available as a 2d Mol file
• Other names: Silicic acid (H4SiO4), tetraethyl ester; Dynasil A; Ethyl orthosilicate; ES 28 (ester); Silane, tetraethoxy-; Silicon ethoxide; Silicon tetraethoxide; Tetraethoxysilane; Tetraethoxysilicon; Tetraethyl orthosilicate; TEOS; (C2H5O)4Si; Ethyl silicate, ((EtO)4Si); Etylu krzemian; Silicate d'ethyle; Silicate tetraethylique; Silicic acid, tetraethyl ester; Tetraethylsilikat; UN 1292; ES 100; ES 28; NSC 4790; Silikan L
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• Information on this page:
  • Gas phase ion energetics data
  • Mass spectrum (electron ionization)
  • Gas Chromatography
  • References
  • Notes
• Other data available:
  • Condensed phase thermochemistry data
  • Phase change data
  • IR Spectrum
• Data at other public NIST sites:
  • Gas Phase Kinetics Database
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Gas phase ion energetics data

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data compiled by: Sharon G. Lias, Rhoda D. Levin, and Sherif A. Kafafi

Ionization energy determinations

Mass spectrum (electron ionization)

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data compiled by: NIST Mass Spectrometry Data Center, William E. Wallace, director

Spectrum

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Additional Data

Gas Chromatography

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data compiled by: NIST Mass Spectrometry Data Center, William E. Wallace, director

Kovats' RI, non-polar column, isothermal

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Kovats' RI, non-polar column, custom temperature program

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Normal alkane RI, non-polar column, isothermal

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References

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Green, Lappert, et al., 1971
Green, M.C.; Lappert, M.F.; Pedley, J.B.; Schmidt, W.; Wilkins, B.T., Photoelectron spectra energy level trends in Me_nSiCl_4-n and related series, J. Organomet. Chem., 1971, 31, 55. [all data]

Kreshkov, Kirichenko, et al., 1975
Kreshkov, A.P.; Kirichenko, É.A.; Markov, B.A., Retention indices of alkoxychlorosilanes, Zh. Anal. Khim., 1975, 30, 2, 286-289. [all data]

Peetre, 1974
Peetre, I.-B., Gas chromatographic investigation of organometallic compounds and their carbon analogues. II. Improved method for calculating retention indices of tetraalkoxysilanes, J. Chromatogr., 1974, 88, 2, 311-321, https://doi.org/10.1016/S0021-9673(00)83155-6 . [all data]

Ellren, Peetre, et al., 1974
Ellren, O.; Peetre, I.B.; Smith, B.E.F., Gas chromatographic investigation of organometallic compounds and their carbon analogues. V. Use of refractive index in conjunction with Kovats retention index for the identification of organosilicon compounds, J. Chromatogr., 1974, 93, 2, 383-392, https://doi.org/10.1016/S0021-9673(01)85402-9 . [all data]

Notes

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• Data from NIST Standard Reference Database 69: NIST Chemistry WebBook
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