Silicon tetrafluoride

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Phase change data

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data compiled as indicated in comments:
BS - Robert L. Brown and Stephen E. Stein
TRC - Thermodynamics Research Center, NIST Boulder Laboratories, Chris Muzny director
AC - William E. Acree, Jr., James S. Chickos

Quantity Value Units Method Reference Comment
Tboil187.KN/APCR Inc., 1990BS
Quantity Value Units Method Reference Comment
Tc259.KN/ABooth and Swinehart, 1935Uncertainty assigned by TRC = 0.02 K; TRC
Quantity Value Units Method Reference Comment
Pc37.1457barN/ABooth and Swinehart, 1935Uncertainty assigned by TRC = 0.0506 bar; TRC

Antoine Equation Parameters

log10(P) = A − (B / (T + C))
    P = vapor pressure (bar)
    T = temperature (K)

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Temperature (K) A B C Reference Comment
163.16 to 186.918.377661643.69818.344Pace and Mosser, 1963Coefficents calculated by NIST from author's data.
129. to 178.37.109781220.564-6.884Stull, 1947Coefficents calculated by NIST from author's data.

Enthalpy of sublimation

ΔsubH (kJ/mol) Temperature (K) Reference Comment
25.8148. to 183.Patnode and Papish, 1929AC

In addition to the Thermodynamics Research Center (TRC) data available from this site, much more physical and chemical property data is available from the following TRC products:


Gas phase ion energetics data

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data evaluated as indicated in comments:
HL - Edward P. Hunter and Sharon G. Lias
L - Sharon G. Lias

Data compiled as indicated in comments:
MM - Michael M. Meot-Ner (Mautner)
LL - Sharon G. Lias and Joel F. Liebman
LBLHLM - Sharon G. Lias, John E. Bartmess, Joel F. Liebman, John L. Holmes, Rhoda D. Levin, and W. Gary Mallard
LLK - Sharon G. Lias, Rhoda D. Levin, and Sherif A. Kafafi
RDSH - Henry M. Rosenstock, Keith Draxl, Bruce W. Steiner, and John T. Herron

Quantity Value Units Method Reference Comment
IE (evaluated)15.24 ± 0.14eVN/AN/AL
Quantity Value Units Method Reference Comment
Proton affinity (review)502.9kJ/molN/AHunter and Lias, 1998HL
Quantity Value Units Method Reference Comment
Gas basicity476.6kJ/molN/AHunter and Lias, 1998HL
Quantity Value Units Method Reference Comment
Δf(+) ion-134. ± 7.1kJ/molN/AN/A 

Proton affinity at 298K

Proton affinity (kJ/mol) Reference Comment
492.0 ± 8.4Ling, Milburn, et al., 1999T = 298K; MM
492.9 ± 8.4Ling, Milburn, et al., 1999T = 298K; MM

Gas basicity at 298K

Gas basicity (review) (kJ/mol) Reference Comment
465.7 ± 8.4Ling, Milburn, et al., 1999T = 298K; MM
466.5 ± 8.4Ling, Milburn, et al., 1999T = 298K; MM

Protonation entropy at 298K

Protonation entropy (J/mol*K) Reference Comment
21.Ling, Milburn, et al., 1999T = 298K; MM
21.Ling, Milburn, et al., 1999T = 298K; MM

Ionization energy determinations

IE (eV) Method Reference Comment
15.29 ± 0.08ENDKickel, Fisher, et al., 1993LL
15.19PIMurphy and Beauchamp, 1977LLK
15. ± 1.EIFarber and Srivastava, 1977LLK
15.7PELloyd and Roberts, 1975LLK
15.81 ± 0.02PEBassett and Lloyd, 1971LLK
15.92PEBull, Pullen, et al., 1970RDSH
15.7 ± 0.1EIMcDonald, Williams, et al., 1968RDSH
16.4PEBieri, Asbrink, et al., 1982Vertical value; LBLHLM
16.5PELloyd and Roberts, 1975Vertical value; LLK
16.45PEFehlner and Turner, 1974Vertical value; LLK
16.46 ± 0.04PEJonas, Schweitzer, et al., 1973Vertical value; LLK

Appearance energy determinations

Ion AE (eV) Other Products MethodReferenceComment
SiF+28.8 ± 0.1?EIMcDonald, Williams, et al., 1968RDSH
SiF2+27.4 ± 0.1?EIMcDonald, Williams, et al., 1968RDSH
F3Si+16.21 ± 0.18FEND/DERKickel, Fisher, et al., 1993LL
SiF3+16.2 ± 0.1F?EIMcDonald, Williams, et al., 1968RDSH

References

Go To: Top, Phase change data, Gas phase ion energetics data, Notes

Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

PCR Inc., 1990
PCR Inc., Research Chemicals Catalog 1990-1991, PCR Inc., Gainesville, FL, 1990, 1. [all data]

Booth and Swinehart, 1935
Booth, H.S.; Swinehart, C.F., Critical Constants and Vapor Pressure of Some Gaseous Fluorides of Group IV, J. Am. Chem. Soc., 1935, 57, 1337. [all data]

Pace and Mosser, 1963
Pace, E.L.; Mosser, J.S., Thermodynamic Properties of Silicon Tetrafluoride from 15 ºK to its Triple Point. The Entropy from Molecular and Spectroscopic Data, J. Chem. Phys., 1963, 39, 1, 154-158, https://doi.org/10.1063/1.1733993 . [all data]

Stull, 1947
Stull, Daniel R., Vapor Pressure of Pure Substances. Organic and Inorganic Compounds, Ind. Eng. Chem., 1947, 39, 4, 517-540, https://doi.org/10.1021/ie50448a022 . [all data]

Patnode and Papish, 1929
Patnode, W.I.; Papish, Jacob, The Vapor Pressure of Silicon Tetrafluoride, J. Phys. Chem., 1929, 34, 7, 1494-1496, https://doi.org/10.1021/j150313a010 . [all data]

Hunter and Lias, 1998
Hunter, E.P.; Lias, S.G., Evaluated Gas Phase Basicities and Proton Affinities of Molecules: An Update, J. Phys. Chem. Ref. Data, 1998, 27, 3, 413-656, https://doi.org/10.1063/1.556018 . [all data]

Ling, Milburn, et al., 1999
Ling, Y.; Milburn, R.K.; Hopkinson, A.C.; Bohme, D.K., Experimental and theoretical studies of the proton affinity of SiF4 and the structure of SiF4H+, J. Am. Soc. Mass Spectrom., 1999, 10, 848. [all data]

Kickel, Fisher, et al., 1993
Kickel, B.L.; Fisher, E.R.; Armentrout, P.B., Dissociative charge-transfer reactions of N+(3P), N2+(2g+), Ar+(2P3/2,1/2), and Kr+(2P3/2) with SiF4. Thermochemistry of SiF4+ and SiF3+, J. Phys. Chem., 1993, 97, 10198. [all data]

Murphy and Beauchamp, 1977
Murphy, M.K.; Beauchamp, J.L., Photoionization mass spectrometry of the fluoromethylsilanes (CH3)n F4-nSi (n = 1-4), J. Am. Chem. Soc., 1977, 99, 2085. [all data]

Farber and Srivastava, 1977
Farber, M.; Srivastava, R.D., Mass spectrometric determination of the heats of formation of the silane fluorides, Chem. Phys. Lett., 1977, 51, 307. [all data]

Lloyd and Roberts, 1975
Lloyd, D.R.; Roberts, P.J., Photoelectron spectra of halides. VII. Variable temperature He(I) and He(II) studies of CF4, SiF4, and GeF4, J. Electron Spectrosc. Relat. Phenom., 1975, 7, 325. [all data]

Bassett and Lloyd, 1971
Bassett, P.J.; Lloyd, D.R., Photoelectron spectra of halides. Part I. Tetrafluorides and tetrachlorides of group IVB, J. Chem. Soc., 1971, (A), 641. [all data]

Bull, Pullen, et al., 1970
Bull, W.E.; Pullen, B.P.; Grimm, F.A.; Moddeman, W.E.; Schweitzer, G.K.; Carlson, T.A., High resolution photoelectron spectroscopy of carbon and silicon tetrafluorides, Inorg. Chem., 1970, 9, 2474. [all data]

McDonald, Williams, et al., 1968
McDonald, J.D.; Williams, C.H.; Thompson, J.C.; Margrave, J.L., Appearance potentials, ionization potentials and heats of formation for perfluorosilanes and perfluoroborosilanes, Advan. Chem. Ser., 1968, 72, 261. [all data]

Bieri, Asbrink, et al., 1982
Bieri, G.; Asbrink, L.; Von Niessen, W., 30.4-nm He(II) photoelectron spectra of organic molecules, J. Electron Spectrosc. Relat. Phenom., 1982, 27, 129. [all data]

Fehlner and Turner, 1974
Fehlner, T.P.; Turner, D.W., The photoelectron spectrum of SiF2, Inorg. Chem., 1974, 13, 754. [all data]

Jonas, Schweitzer, et al., 1973
Jonas, A.E.; Schweitzer, G.K.; Grimm, F.A.; Carlson, T.A., The photoelectron spectra of the tetrafluoro and tetramethyl compounds of the group IV elements, J. Electron Spectrosc. Relat. Phenom., 1973, 1, 29. [all data]


Notes

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