Dioxosilane

• Formula: O₂Si
• Molecular weight: 60.0843
• IUPAC Standard InChI: InChI=1S/O2Si/c1-3-2 Copy

  
• IUPAC Standard InChIKey: VYPSYNLAJGMNEJ-UHFFFAOYSA-N Copy
• CAS Registry Number: 7631-86-9
• Chemical structure:
  This structure is also available as a 2d Mol file or as a computed 3d SD file
  The 3d structure may be viewed using Java or Javascript.
• Species with the same structure:
  • Quartz (SiO2)
  • Silica, vitreous
• Other names: Amorphous silica; Hydrolyzed silica (cab-o-sil); Crystalline silica; Silicon dioxide; Silica; Silicon(iv) oxide
• Information on this page:
  • IR Spectrum
  • Vibrational and/or electronic energy levels
  • References
  • Notes
• Other data available:
  • Gas phase thermochemistry data
  • Condensed phase thermochemistry data
  • Phase change data
  • THz IR spectrum
• Data at other public NIST sites:
  • Gas Phase Kinetics Database
  • X-ray Photoelectron Spectroscopy Database, version 5.0
  • X-ray Photoelectron Spectroscopy Database, version 5.0
  • X-ray Photoelectron Spectroscopy Database, version 5.0
• Options:
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IR Spectrum

Go To: Top, Vibrational and/or electronic energy levels, References, Notes

Data compiled by: Coblentz Society, Inc.

• Not specified, most likely a prism, grating, or hybrid spectrometer.; (NO SPECTRUM, ONLY SCANNED IMAGE IS AVAILABLE)
• SOLID (0.5 mg / 300 mg CsI DISC); BECKMAN IR-12 (GRATING); DIGITIZED BY NIST FROM HARD COPY (FROM TWO SEGMENTS)
  4, 4 cm^-1 resolution
• SOLID (0.5 mg / 300 mg CsI PELLET); Not specified, most likely a grating spectrometer.; DIGITIZED BY NIST FROM HARD COPY (FROM TWO SEGMENTS); 4 cm^-1 resolution
• SOLID (MULL) $$ SEE 4662 FOR KBr DISC; PERKIN-ELMER 521 (GRATING); 2 cm^-1 resolution

Vibrational and/or electronic energy levels

Go To: Top, IR Spectrum, References, Notes

Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data compiled by: Marilyn E. Jacox

State:   X

Additional references: Jacox, 1994, page 86

References

Go To: Top, IR Spectrum, Vibrational and/or electronic energy levels, Notes

Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Andrews and McCluskey, 1992
Andrews, L.; McCluskey, M., Bending modes of SiO2 and GeO2 in solid argon, J. Mol. Spectrosc., 1992, 154, 1, 223, https://doi.org/10.1016/0022-2852(92)90042-M . [all data]

Schnockel, 1978
Schnockel, H., IR-spektroskopischer Nachweis von molekularem SiO2, Angew. Chem., 1978, 90, 8, 638, https://doi.org/10.1002/ange.19780900821 . [all data]

Schnockel, 1980
Schnockel, H., Matrixreaktionen von SiO. IR-spektroskopischer Nachweis der Molekeln SiO2 und OSiCl2, Z. Anorg. Allg. Chem., 1980, 460, 1, 37, https://doi.org/10.1002/zaac.19804600104 . [all data]

Jacox, 1994
Jacox, M.E., Vibrational and electronic energy levels of polyatomic transient molecules, American Chemical Society, Washington, DC, 1994, 464. [all data]

Notes

Go To: Top, IR Spectrum, Vibrational and/or electronic energy levels, References

• Data from NIST Standard Reference Database 69: NIST Chemistry WebBook
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