Silane, tetraethyl-
- Formula: C8H20Si
- Molecular weight: 144.3299
- IUPAC Standard InChIKey: VCZQFJFZMMALHB-UHFFFAOYSA-N
- CAS Registry Number: 631-36-7
- Chemical structure:
This structure is also available as a 2d Mol file or as a computed 3d SD file
The 3d structure may be viewed using Java or Javascript. - Other names: Tetraethylsilane; Tetraethylsilicon; (C2H5)4Si
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Gas phase ion energetics data
Go To: Top, IR Spectrum, Mass spectrum (electron ionization), References, Notes
Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.
Data compiled as indicated in comments:
LLK - Sharon G. Lias, Rhoda D. Levin, and Sherif A. Kafafi
RDSH - Henry M. Rosenstock, Keith Draxl, Bruce W. Steiner, and John T. Herron
Ionization energy determinations
IE (eV) | Method | Reference | Comment |
---|---|---|---|
8.9 | PE | Potzinger, Ritter, et al., 1975 | LLK |
10.5 | EI | deRidder and Dijkstra, 1967 | RDSH |
9.8 | PE | Beltram, Fehlner, et al., 1980 | Vertical value; LLK |
Appearance energy determinations
Ion | AE (eV) | Other Products | Method | Reference | Comment |
---|---|---|---|---|---|
C2H5Si+ | 19.4 | ? | EI | deRidder and Dijkstra, 1967 | RDSH |
C2H7Si+ | 11.8 | ? | EI | deRidder and Dijkstra, 1967 | RDSH |
C4H11Si+ | 12.5 | ? | EI | deRidder and Dijkstra, 1967 | RDSH |
C6H15Si+ | 10.0 ± 0.1 | C2H5 | EI | Potzinger, Ritter, et al., 1975 | LLK |
C6H15Si+ | 11.0 | ? | EI | deRidder and Dijkstra, 1967 | RDSH |
SiH+ | 26.8 | ? | EI | deRidder and Dijkstra, 1967 | RDSH |
SiH2+ | 25.7 | ? | EI | deRidder and Dijkstra, 1967 | RDSH |
SiH3+ | 20.6 | ? | EI | deRidder and Dijkstra, 1967 | RDSH |
Si+ | 28.0 | ? | EI | deRidder and Dijkstra, 1967 | RDSH |
IR Spectrum
Go To: Top, Gas phase ion energetics data, Mass spectrum (electron ionization), References, Notes
Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.
Data compiled by: Coblentz Society, Inc.
Condensed Phase Spectrum
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Notice: Except where noted, spectra from this collection were measured on dispersive instruments, often in carefully selected solvents, and hence may differ in detail from measurements on FTIR instruments or in other chemical environments. More information on the manner in which spectra in this collection were collected can be found here.
Notice: Concentration information is not available for this spectrum and, therefore, molar absorptivity values cannot be derived.
Additional Data
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Owner | COBLENTZ SOCIETY Collection (C) 2018 copyright by the U.S. Secretary of Commerce on behalf of the United States of America. All rights reserved. |
---|---|
Origin | PENINSULAR CHEMRESEARCH, INC., GAINESVILLE, FLORIDA |
Source reference | COBLENTZ NO. 4899 |
Date | Not specified, most likely prior to 1970 |
State | SOLID (BETWEEN SALTS) |
Instrument | BECKMAN IR-4 (HYBRID PRISM-GRATING) |
Resolution | 4 MW 144.33 |
Sampling procedure | TRANSMISSION |
Data processing | DIGITIZED BY NIST FROM HARD COPY |
Mass spectrum (electron ionization)
Go To: Top, Gas phase ion energetics data, IR Spectrum, References, Notes
Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.
Data compiled by: NIST Mass Spectrometry Data Center, William E. Wallace, director
Spectrum
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Additional Data
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Due to licensing restrictions, this spectrum cannot be downloaded.
Owner | NIST Mass Spectrometry Data Center Collection (C) 2014 copyright by the U.S. Secretary of Commerce on behalf of the United States of America. All rights reserved. |
---|---|
Origin | Japan AIST/NIMC Database- Spectrum MS-IW-7605 |
NIST MS number | 227699 |
References
Go To: Top, Gas phase ion energetics data, IR Spectrum, Mass spectrum (electron ionization), Notes
Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.
Potzinger, Ritter, et al., 1975
Potzinger, P.; Ritter, A.; Krause, J.,
Massenspektrometrische Bestimmung von Bindungsenergien in siliciumorganischen Verbindungen,
Z. Naturforsch. A:, 1975, 30, 347. [all data]
deRidder and Dijkstra, 1967
deRidder, J.J.; Dijkstra, G.,
Mass spectra of the tetramethyl and tetraethyl compounds of carbon, silicon, germanium, tin and lead,
Rec. Trav. Chim., 1967, 86, 737. [all data]
Beltram, Fehlner, et al., 1980
Beltram, G.; Fehlner, T.P.; Mochida, K.; Kochi, J.K.,
UV photoelectron spectra of group IV alkyl hydrides,
J. Electron Spectrosc. Relat. Phenom., 1980, 18, 153. [all data]
Notes
Go To: Top, Gas phase ion energetics data, IR Spectrum, Mass spectrum (electron ionization), References
- Symbols used in this document:
AE Appearance energy - Data from NIST Standard Reference Database 69: NIST Chemistry WebBook
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