Si15


Gas phase ion energetics data

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data compiled by: John E. Bartmess

Electron affinity determinations

EA (eV) Method Reference Comment
3.10 ± 0.19LPESOhara, Koyasu, et al., 2003 
>2.99997LPDLiu, Zhang, et al., 1986 

References

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Ohara, Koyasu, et al., 2003
Ohara, M.; Koyasu, K.; Nakajima, A.; Kaya, K., Geometric and Electronic Structures of metal (M)-Doped Silicon Clusters (M=Ti, Hf, Mo, and W), Chem. Phys. Lett., 2003, 371, 3-4, 490-497., https://doi.org/10.1016/S0009-2614(03)00299-9 . [all data]

Liu, Zhang, et al., 1986
Liu, Y.; Zhang, Q.-L.; Tittel, F.K.; Curl, R.F.; Smalley, R.E., Photodetachment and Photofragmentation Studies of Semiconductor Cluster Anions, J. Chem. Phys., 1986, 85, 12, 7434, https://doi.org/10.1063/1.451332 . [all data]


Notes

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