Si8
- Formula: Si8
- Molecular weight: 224.6840
- CAS Registry Number: 119467-68-4
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Gas phase ion energetics data
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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.
Data compiled by: John E. Bartmess
Electron affinity determinations
| EA (eV) | Method | Reference | Comment |
|---|---|---|---|
| 2.30 ± 0.20 | LPES | Ohara, Koyasu, et al., 2003 | |
| 2.36 ± 0.10 | LPES | Kawamata, Neigishi, et al., 1996 | Vertical Detachment Energy: 2.6640±0.06 eV. |
| 1.95 ± 0.25 | LPES | Nakajima, Taguwa, et al., 1995 | Vertical Detachment Energy: 2.55±0.15 eV. |
| 2.09 ± 0.15 | LPES | Kishi, Kawamata, et al., 1997 | Vertical Detachment Energy: 2.34±.06 eV |
| 2.30 ± 0.20 | LPES | Cheshnovsky, Yang, et al., 1987 | EA given is Vertical Detachment Energy. Adiabatic EA est as up to 1 eV smaller |
| <2.33997 | LPD | Liu, Zhang, et al., 1986 |
References
Go To: Top, Gas phase ion energetics data, Notes
Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.
Ohara, Koyasu, et al., 2003
Ohara, M.; Koyasu, K.; Nakajima, A.; Kaya, K.,
Geometric and Electronic Structures of metal (M)-Doped Silicon Clusters (M=Ti, Hf, Mo, and W),
Chem. Phys. Lett., 2003, 371, 3-4, 490-497., https://doi.org/10.1016/S0009-2614(03)00299-9
. [all data]
Kawamata, Neigishi, et al., 1996
Kawamata, H.; Neigishi, Y.; Kishi, R.; Iwata, S.; Nakajima, A.; Kaya, K.,
Photoelectron Spectroscopy of Silicon-Fluorine Binary Cluster Anions (SinFm-),
J. Chem. Phys., 1996, 105, 13, 5369, https://doi.org/10.1063/1.472377
. [all data]
Nakajima, Taguwa, et al., 1995
Nakajima, A.; Taguwa, T.; Nakao, K.; Gomei, M.; Kishi, R.; Iwata, S.; Kaya, K.,
Photoelectron Spectroscopy of silicon-carbon cluster Anions (SinCm-),
J. Chem. Phys., 1995, 103, 6, 2050, https://doi.org/10.1063/1.469731
. [all data]
Kishi, Kawamata, et al., 1997
Kishi, R.; Kawamata, H.; Neigishi, Y.; Iwata, S.; Nakajima, A.; Kaya, K.,
Geometric and Electronic Structures of Silicon-Sodium Binary Clusters. II. Photoelectron Spectroscopy of SinNam Cluster Anions,
J. Chem. Phys., 1997, 107, 23, 10029, https://doi.org/10.1063/1.474160
. [all data]
Cheshnovsky, Yang, et al., 1987
Cheshnovsky, O.; Yang, S.H.; Pettiette, C.L.; Craycraft, M.J.; Liu, Y.; Smalley, R.E.,
Ultraviolet Photoelectron Spectroscopy of Semiconductor Clusters: Silicon and Germanium,
Chem. Phys. Lett., 1987, 138, 2-3, 119, https://doi.org/10.1016/0009-2614(87)80353-6
. [all data]
Liu, Zhang, et al., 1986
Liu, Y.; Zhang, Q.-L.; Tittel, F.K.; Curl, R.F.; Smalley, R.E.,
Photodetachment and Photofragmentation Studies of Semiconductor Cluster Anions,
J. Chem. Phys., 1986, 85, 12, 7434, https://doi.org/10.1063/1.451332
. [all data]
Notes
Go To: Top, Gas phase ion energetics data, References
- Symbols used in this document:
EA Electron affinity - Data from NIST Standard Reference Database 69: NIST Chemistry WebBook
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