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Gofman, M.M.; Nefedov, V.I.; Kraizman, V.L.; Vedrinski, R.V., Relative intensities in x-ray photoelectron spectra. Part X*. Near-threshold structure of photoionization cross-sections of molecular valence shells, J. Electron Spectrosc. Relat. Phenom., 1983, 32, 59-72. [all data]