National Institute of Standards and Technology

NIST Chemistry WebBook, SRD 69

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Toshii, H.

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Lu, Y.; Morioka, Y.; Matsui, T.; Tanaka, T.; Toshii, H.; Hall, R.I.; Hayaishi, T.; Ito, K., Ground and excited states of Xe₂⁺ observed by high resolution threshold photoelectron spectroscopy of Xe₂, J. Chem. Phys., 1995, 102, 1553. [all data]