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4 matching references were found.

Biehl, H.; Boyle, K.J.; Seccombe, D.P.; Smith, D.M.; Tuckett, R.P.; Yoxall, K.R.; Baumgartel, H.; Jochims, H.W., Vacuum-UV fluorescence spectroscopy of SiF[sub 4] in the range 10--30 eV, J. Chem. Phys., 1997, 107, 3, 720, https://doi.org/10.1063/1.474437 . [all data]

Biehl, H.; Boule, K.J.; Seccombe, D.P.; Tuckett, R.P.; Baumgartel, H.; Jochims, H.W., Vacuum-UV fluorescence spectroscopy of PF[sub 3] in the range 9--20 eV, J. Chem. Phys., 1998, 108, 3, 857, https://doi.org/10.1063/1.475449 . [all data]

Biehl, H.; Boyle, K.I.; Seccombe, D.P.; Smith, D.M.; Tuckett, R.P.; Baumgartel, H.; Jochims, H.W., Vacuum--UV fluorescence spectroscopy of CCl4, SiCl4 and GeCl4 in the range 9--25eV, J. Electron Spectrosc. Relat. Phenom., 1998, 97, 1-2, 89, https://doi.org/10.1016/S0368-2048(98)00261-8 . [all data]

Boyle, K.J.; Seccombe, D.P.; Tuckett, R.P.; Baumgartel, H.; Jochims, H.W., Vacuum--UV fluorescence spectroscopy of GeF4 in the 10--25 eV range, Chem. Phys. Lett., 1998, 294, 6, 507, https://doi.org/10.1016/S0009-2614(98)00881-1 . [all data]