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| Author: | Pollard, J. |
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10 matching references were found.
Hepburn, J.W.; Trevor, D.J.; Pollard, J.E.; Shirley, D.A.; Lee, Y.T., Multiphoton ionization photoelectron spectroscopy of CCl2F2 and CCl3F, J. Chem. Phys., 1982, 76, 4287. [all data]
Pollard, J.E.; Trevor, D.J.; Reutt, J.E.; Lee, Y.T.; Shirley, D.A., Torsional potential and intramolecular dynamics in the C2H4+ photoelectron spectra, J. Chem. Phys., 1984, 81, 5302. [all data]
Trevor, D.J.; Pollard, J.E.; Brewer, W.D.; Southworth, S.H.; Truesdale, C.M.; Shirley, D.A.; Lee, Y.T., Photoionization mass spectrometry of Ne dimers, J. Chem. Phys., 1984, 80, 6083. [all data]
Reutt, J.E.; Wang, L.S.; Pollard, J.E.; Trevor, D.J.; Lee, Y.T.; Shirley, D.A., Photoelectron spectroscopy and inferred femtosecond intramolecular dynamics of C2H+2 and C2D+2, J. Chem. Phys., 1986, 84, 6, 3022, https://doi.org/10.1063/1.450283 . [all data]
Wang, L.; Pollard, J.E.; Lee, Y.T.; Shirley, D.A., Molecular beam photoelectron spectroscopy: The C2D4+(X 2B3) ground state, J. Chem. Phys., 1987, 86, 6, 3216, https://doi.org/10.1063/1.451979 . [all data]
Hepburn, J.W.; Trevor, D.J.; Pollard, J.E.; Shirley, D.A.; Lee, Y.T., Multiphoton ionization photoelectron spectroscopy of CCl2F2 and CCl3F, J. Chem. Phys., 1982, 76, 4287-4288. [all data]
Pollard, J.E.; Trevor, D.J.; Reutt, J.E.; Lee, Y.T.; Shirley, D.A., Rotationally resolved photoelectron spectroscopy of n-H2, p-H2, HD, and D2, J. Chem. Phys., 1982, 77, 34-46. [all data]
Pollard, J.E.; Trevor, D.J.; Reutt, J.E.; Lee, Y.T.; Shirley, D.A., Rotationally resolved photoelectron angular distributions for H2+ (v' = 0) at λ = 584 and 736 Å, Chem. Phys. Lett., 1982, 88, 434-438. [all data]
Pollard, J.E.; Trevor, D.J.; Lee, Y.T.; Shirley, D.A., Rotational relaxation in supersonic beams of hydrogen by high resolution photoelectron spectroscopy, J. Chem. Phys., 1982, 77, 4818-4825. [all data]
Trevor, D.J.; Pollard, J.E.; Brewer, W.D.; Southworth, S.H.; Truesdale, C.M.; Shirley, D.A.; Lee, Y.T., Photoionization mass spectroscopy of Ne dimers, J. Chem. Phys., 1984, 80, 6083-6091. [all data]