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| Author: | Muigg |
Only one matching reference was found.
Muigg, D.; Scheier, P.; Becker, K.; Mark, T.D., Measured appearance energies of Cn+ (3 ≤ n ≤ 10) fragment ions produced by electron impact on C60, J. Phys. B:, 1996, 29, 5193. [all data]