National Institute of Standards and Technology

NIST Chemistry WebBook, SRD 69

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Morsell, A.L.

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Main, R.P.; Morsell, A.L.; Hooker, W.J., Measurement of the oscillator strength of the SiO (A¹Π - X¹Σ⁺) band system, J. Quant. Spectrosc. Radiat. Transfer, 1968, 8, 1527. [all data]