National Institute of Standards and Technology

NIST Chemistry WebBook, SRD 69

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Milles, J.M.

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Zheng, W.; Milles, J.M.; Radisic, D.; Bowen, K.H., Jr., Photoelectron Spectroscopy of Chromium-Doped Silicon Cluster Anions, J. Chem. Phys., 2005, 122, 7, 071101, https://doi.org/10.1063/1.1851984 . [all data]