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| Author: | Mark, E. |
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3 matching references were found.
Stephan, K.; Helm, H.; Kim, Y.B.; Seykora, G.; Ramler, J.; Grossl, M.; Mark, E.; Mark, T.D., Single and double ionization of nitrogen dioxide by electron impact from threshold up to 180 eV, J. Chem. Phys., 1980, 73, 303. [all data]
Kim, Y.B.; Stephan, K.; Mark, E.; Mark, T.D., Single and double ionization of nitric oxide by electron impact from threshold up to 180 eV, J. Chem. Phys., 1981, 74, 6771. [all data]
Kim, Y.B.; Stephan, K.; Mark, E.; Mark, T.D., Single and double ionization of nitric oxide by electron impact from threshold up to 180 eV, J. Chem. Phys., 1981, 74, 6771-6776. [all data]
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