Search Results
Search criteria:
| Author: | Drag, C. |
You may also wish to search for items by Drag.
6 matching references were found.
Blondel, C.; Chaibi, W.; Delsart, C.; Drag, C.; Goldfarb, F.; Kroger, S., The electron affinities of O, Si, and S revisited with the photodetachment microscope, Eur. Phys. J. D, 2005, 33, 3, 335-342, https://doi.org/10.1140/epjd/e2005-00069-9 . [all data]
Chaibi, W.; Delsart, C.; Drag, C.; Blondel, C., High precision measurement of the (SH)-S-32 electron affinity by laser detachment microscopy, J. Molec. Spectros., 2006, 239, 1, 11-15, https://doi.org/10.1016/j.jms.2006.05.012 . [all data]
Pelaez, R.J.; Blondel, C.; Delsart, C.; Drag, C., Pulsed photodetachment microscopy and the electron affinity of iodine, J. Phys. B: Atom. Mol. Opt. Phys., 2009, 42, 12, 125001, https://doi.org/10.1088/0953-4075/42/12/125001 . [all data]
Pelaez, R.J.; Blondel, C.; Vandevraye, M.; Drag, C.; Delsart, C., Photodetachment microscopy to an excited spectral term and the electron affinity of phosphorus, J. Phys. B: Atom. Mol. Opt. Phys., 2011, 44, 19, 195009, https://doi.org/10.1088/0953-4075/44/19/195009 . [all data]
Vandevraye, M.; Drag, C.; Blondel, C., Electron affinity of tin measured by photodetachment microscopy, J. Phys. B: Atom. Mol. Opt. Phys., 2013, 46, 12, 125002, https://doi.org/10.1088/0953-4075/46/12/125002 . [all data]
Vandevraye, M.; Drag, C.; Blondel, C., Electron affinity of selenium measured by photodetachment microscopy, Phys. Rev. A, 2012, 85, 1, 015401, https://doi.org/10.1103/PhysRevA.85.015401 . [all data]
© 2026 by the U.S. Secretary of Commerce on behalf of the United States of America. All rights reserved.
Copyright for NIST Standard Reference Data is governed by the Standard Reference Data Act.