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7 matching references were found.

Blondel, C.; Chaibi, W.; Delsart, C.; Drag, C.; Goldfarb, F.; Kroger, S., The electron affinities of O, Si, and S revisited with the photodetachment microscope, Eur. Phys. J. D, 2005, 33, 3, 335-342, https://doi.org/10.1140/epjd/e2005-00069-9 . [all data]

Chaibi, W.; Delsart, C.; Drag, C.; Blondel, C., High precision measurement of the (SH)-S-32 electron affinity by laser detachment microscopy, J. Molec. Spectros., 2006, 239, 1, 11-15, https://doi.org/10.1016/j.jms.2006.05.012 . [all data]

Pelaez, R.J.; Blondel, C.; Delsart, C.; Drag, C., Pulsed photodetachment microscopy and the electron affinity of iodine, J. Phys. B: Atom. Mol. Opt. Phys., 2009, 42, 12, 125001, https://doi.org/10.1088/0953-4075/42/12/125001 . [all data]

Pelaez, R.J.; Blondel, C.; Vandevraye, M.; Drag, C.; Delsart, C., Photodetachment microscopy to an excited spectral term and the electron affinity of phosphorus, J. Phys. B: Atom. Mol. Opt. Phys., 2011, 44, 19, 195009, https://doi.org/10.1088/0953-4075/44/19/195009 . [all data]

Blondel, C.; Delsart, C.; Goldfarb, F., Electron spectrometry at the mu eV level and the electron affinities of Si and F, J. Phys. B: Atom. Mol. Opt. Phys., 2001, 34, 9, L281-L288, https://doi.org/10.1088/0953-4075/34/9/101 . [all data]

Blondel, C.; Cacciani, P.; Delsart, C.; Trainham, R., High Resolution Determination of the Electron Affinity of Fluorine and Bromine using Crossed Ion and Laser Beams, Phys. Rev. A, 1989, 40, 7, 3698, https://doi.org/10.1103/PhysRevA.40.3698 . [all data]

Valli, C.; Blondel, C.; Delsart, C., Measuring electron affinities with the photodetachment microscope, Phys. Rev. A, 1999, 59, 5, 3809-3815, https://doi.org/10.1103/PhysRevA.59.3809 . [all data]