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(CH3)2Si


Vibrational and/or electronic energy levels

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data compiled by: Marilyn E. Jacox

State:   ?


 Energy 
 (cm-1
 Med.   Transition   «lambda»min 
 (nm) 
 «lambda»max 
 (nm) 
 References

Txd = 22200 Ar Drahnak, Michl, et al., 1979
Drahnak, Michl, et al., 1981
Arrington, Klingensmith, et al., 1984
Maier, Mihm, et al., 1984

State:   ?


 Energy 
 (cm-1
 Med.   Transition   «lambda»min 
 (nm) 
 «lambda»max 
 (nm) 
 References

Txd = 22200 N2 Drahnak, Michl, et al., 1979
Drahnak, Michl, et al., 1981
Arrington, Klingensmith, et al., 1984
Maier, Mihm, et al., 1984

State:   X


Vib. 
sym. 
 No.   Approximate 
 type of mode 
 cm-1   Med.   Method   References

a1 4 CH3 s-deform. 1222 s Ar IR Drahnak, Michl, et al., 1979
Arrington, Klingensmith, et al., 1984
Raabe, Vancik, et al., 1986
5 CH3 plan. rock 844 vs Ar IR Reisenauer, Mihm, et al., 1982
Arrington, Klingensmith, et al., 1984
Maier, Mihm, et al., 1984
Raabe, Vancik, et al., 1986
5 CH3 plan. rock 844 vs N2 IR Reisenauer, Mihm, et al., 1982
Arrington, Klingensmith, et al., 1984
Maier, Mihm, et al., 1984
Raabe, Vancik, et al., 1986
6 Si-C stretch 690 w Ar IR Arrington, Klingensmith, et al., 1984
Raabe, Vancik, et al., 1986
6 Si-C stretch 690 w N2 IR Arrington, Klingensmith, et al., 1984
Raabe, Vancik, et al., 1986
b1 12 CH3 stretch 2942 m Ar IR Raabe, Vancik, et al., 1986
13 CH3 a-deform. 1435 m Ar IR Drahnak, Michl, et al., 1981
Arrington, Klingensmith, et al., 1984
Raabe, Vancik, et al., 1986
b2 17 CH3 stretch 2977 s Ar IR Raabe, Vancik, et al., 1986
19 CH3 s-deform. 1212 s Ar IR Arrington, Klingensmith, et al., 1984
Raabe, Vancik, et al., 1986
20 CH3 plan. rock 803 vs Ar IR Arrington, Klingensmith, et al., 1984
Raabe, Vancik, et al., 1986
20 CH3 plan. rock 803 vs N2 IR Arrington, Klingensmith, et al., 1984
Raabe, Vancik, et al., 1986
21 Si-C stretch 735 m T Ar IR Arrington, Klingensmith, et al., 1984
21 Si-C stretch 735 m T N2 IR Arrington, Klingensmith, et al., 1984

Additional references: Jacox, 1994, page 399

Notes

wWeak
mMedium
sStrong
vsVery strong
TTentative assignment or approximate value
xEnergy separation between the band maximum of the excited electronic state and the v = 0 level of the ground state.
dPhotodissociation threshold

References

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Drahnak, Michl, et al., 1979
Drahnak, T.J.; Michl, J.; West, R., Dimethylsilylene, (CH3)2Si, J. Am. Chem. Soc., 1979, 101, 18, 5427, https://doi.org/10.1021/ja00512a059 . [all data]

Drahnak, Michl, et al., 1981
Drahnak, T.J.; Michl, J.; West, R., Photoisomerization of dimethylsilylene to 2-silapropene and thermal reversion to dimethylsilylene, J. Am. Chem. Soc., 1981, 103, 7, 1845, https://doi.org/10.1021/ja00397a047 . [all data]

Arrington, Klingensmith, et al., 1984
Arrington, C.A.; Klingensmith, K.A.; West, R.; Michl, J., Polarized infrared spectroscopy of matrix-isolated dimethylsilylene and 1-methylsilene, J. Am. Chem. Soc., 1984, 106, 3, 525, https://doi.org/10.1021/ja00315a010 . [all data]

Maier, Mihm, et al., 1984
Maier, G.; Mihm, G.; Reisenauer, H.P.; Littmann, D., Hetero-«pi»-Systeme, 9. Über die Beziehungen zwischen Silaethenen und Methylsilylenen, Chem. Ber., 1984, 117, 7, 2369, https://doi.org/10.1002/cber.19841170709 . [all data]

Raabe, Vancik, et al., 1986
Raabe, G.; Vancik, H.; West, R.; Michl, J., IR transition moment directions in matrix-isolated dimethylsilylene and 1-methylsilene, J. Am. Chem. Soc., 1986, 108, 4, 671, https://doi.org/10.1021/ja00264a017 . [all data]

Reisenauer, Mihm, et al., 1982
Reisenauer, H.P.; Mihm, G.; Maier, G., Reversible Photoisomerisierung zwischen Silaethenen und Methylsilylenen (Methylsilandiylen), Angew. Chem., 1982, 94, 11, 864, https://doi.org/10.1002/ange.19820941110 . [all data]

Jacox, 1994
Jacox, M.E., Vibrational and electronic energy levels of polyatomic transient molecules, American Chemical Society, Washington, DC, 1994, 464. [all data]


Notes

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