silicon
- Formula: Si
- Molecular weight: 28.0855
- IUPAC Standard InChI: InChI=1S/Si
- IUPAC Standard InChIKey: XUIMIQQOPSSXEZ-UHFFFAOYSA-N
- CAS Registry Number: 7440-21-3
- Chemical structure:
This structure is also available as a 2d Mol file - Permanent link for this species. Use this link for bookmarking this species for future reference.
- Information on this page:
- Other data available:
- Data at other public NIST sites:
- NIST Atomic Spectra Database - Lines Holdings (on physics web site)
- NIST Atomic Spectra Database - Levels Holdings (on physics web site)
- NIST Atomic Spectra Database - Ground states and ionization energies (on physics web site)
- Computational Chemistry Comparison and Benchmark Database
- Gas Phase Kinetics Database
- X-ray Photoelectron Spectroscopy Database, version 5.0
- Options:
Gas phase ion energetics data
Go To: Top, References, Notes
Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.
Data evaluated as indicated in comments:
HL - Edward P. Hunter and Sharon G. Lias
L - Sharon G. Lias
Data compiled as indicated in comments:
LL - Sharon G. Lias and Joel F. Liebman
LBLHLM - Sharon G. Lias, John E. Bartmess, Joel F. Liebman, John L. Holmes, Rhoda D. Levin, and W. Gary Mallard
LLK - Sharon G. Lias, Rhoda D. Levin, and Sherif A. Kafafi
RDSH - Henry M. Rosenstock, Keith Draxl, Bruce W. Steiner, and John T. Herron
B - John E. Bartmess
View reactions leading to Si+ (ion structure unspecified)
| Quantity | Value | Units | Method | Reference | Comment |
|---|---|---|---|---|---|
| IE (evaluated) | 8.15169 | eV | N/A | N/A | L |
| Quantity | Value | Units | Method | Reference | Comment |
| Proton affinity (review) | 837. | kJ/mol | N/A | Hunter and Lias, 1998 | HL |
| Quantity | Value | Units | Method | Reference | Comment |
| Gas basicity | 814.1 | kJ/mol | N/A | Hunter and Lias, 1998 | HL |
Electron affinity determinations
| EA (eV) | Method | Reference | Comment |
|---|---|---|---|
| 1.389517 ± 0.000044 | LPD | Blondel, Chaibi, et al., 2005 | (28)Si: 1.3895213(13) eV; revised analysis of Blondel, Delsart, et al., 2001; B |
| 1.38952 | LPD | Blondel, Delsart, et al., 2001 | Given: 1.3895220(24) eV, or 11207.252(18) cm-1; B |
| 1.389517 ± 0.000044 | LPD | Scheer, Bilodeau, et al., 1998 | Given: 1.389521(20) eV; B |
| 1.3850 ± 0.0050 | LPES | Kasdan, Herbst, et al., 1975 | B |
Ionization energy determinations
| IE (eV) | Method | Reference | Comment |
|---|---|---|---|
| 8.15169 | EVAL | Lide, 1992 | LL |
| 8.152 | S | Kelly, 1987 | LBLHLM |
| 8.2 ± 0.5 | EI | Muenow, 1974 | LLK |
| 8.15166 ± 0.00003 | S | Brown, Tilford, et al., 1974 | LLK |
| 8.1 ± 0.5 | EI | Guido and Gigli, 1973 | LLK |
| 8.5 ± 0.5 | EI | Hildenbrand, 1972 | LLK |
| 8.15169 | S | Moore, 1970 | RDSH |
References
Go To: Top, Gas phase ion energetics data, Notes
Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.
Hunter and Lias, 1998
Hunter, E.P.; Lias, S.G.,
Evaluated Gas Phase Basicities and Proton Affinities of Molecules: An Update,
J. Phys. Chem. Ref. Data, 1998, 27, 3, 413-656, https://doi.org/10.1063/1.556018
. [all data]
Blondel, Chaibi, et al., 2005
Blondel, C.; Chaibi, W.; Delsart, C.; Drag, C.; Goldfarb, F.; Kroger, S.,
The electron affinities of O, Si, and S revisited with the photodetachment microscope,
Eur. Phys. J. D, 2005, 33, 3, 335-342, https://doi.org/10.1140/epjd/e2005-00069-9
. [all data]
Blondel, Delsart, et al., 2001
Blondel, C.; Delsart, C.; Goldfarb, F.,
Electron spectrometry at the mu eV level and the electron affinities of Si and F,
J. Phys. B: Atom. Mol. Opt. Phys., 2001, 34, 9, L281-L288, https://doi.org/10.1088/0953-4075/34/9/101
. [all data]
Scheer, Bilodeau, et al., 1998
Scheer, M.; Bilodeau, R.C.; Brodie, C.A.; Haugen, H.K.,
Systematic study of the stable states of C-, Si-, Ge-, and Sn- via infrared laser spectroscopy,
Phys. Rev. A, 1998, 58, 4, 2844-2856, https://doi.org/10.1103/PhysRevA.58.2844
. [all data]
Kasdan, Herbst, et al., 1975
Kasdan, A.; Herbst, E.; Lineberger, W.C.,
Laser photoelectron spectrometry of the negative ions of silicon and its hydrides,
J. Chem. Phys., 1975, 62, 541. [all data]
Lide, 1992
Lide, D.R. (Editor),
Ionization potentials of atoms and atomic ions
in Handbook of Chem. and Phys., 1992, 10-211. [all data]
Kelly, 1987
Kelly, R.L.,
Atomic and ionic spectrum lines of hydrogen through kryton,
J. Phys. Chem. Ref. Data, 1987, 16. [all data]
Muenow, 1974
Muenow, D.W.,
Mass spectrometric determination of the heats of formation and atomization energies of the molecules Ge2N and GeSiN,
J. Chem. Phys., 1974, 60, 3382. [all data]
Brown, Tilford, et al., 1974
Brown, C.M.; Tilford, S.G.; Tousey, R.; Ginter, M.L.,
Absorption spectrum of Si I between 1500 and 1900 A,
J. Opt. Soc. Am., 1974, 64, 1665. [all data]
Guido and Gigli, 1973
Guido, M.; Gigli, G.,
Mass spectrometric study of the CeSiC molecules,
J. Chem. Phys., 1973, 59, 3437. [all data]
Hildenbrand, 1972
Hildenbrand, D.L.,
The gaseous equilibrium Ge + SiO = GeO + Si and the dissociation energy of SiO,
High Temp. Sci., 1972, 4, 244. [all data]
Moore, 1970
Moore, C.E.,
Ionization potentials and ionization limits derived from the analyses of optical spectra,
Natl. Stand. Ref. Data Ser., (U.S. Natl. Bur. Stand.), 1970, 34, 1. [all data]
Notes
Go To: Top, Gas phase ion energetics data, References
- Symbols used in this document:
EA Electron affinity IE (evaluated) Recommended ionization energy - Data from NIST Standard Reference Database 69: NIST Chemistry WebBook
- The National Institute of Standards and Technology (NIST) uses its best efforts to deliver a high quality copy of the Database and to verify that the data contained therein have been selected on the basis of sound scientific judgment. However, NIST makes no warranties to that effect, and NIST shall not be liable for any damage that may result from errors or omissions in the Database.
- Customer support for NIST Standard Reference Data products.