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Silicon tetrafluoride

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Gas phase ion energetics data

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data evaluated as indicated in comments:
HL - Edward P. Hunter and Sharon G. Lias
L - Sharon G. Lias

Data compiled as indicated in comments:
MM - Michael M. Meot-Ner (Mautner)
LL - Sharon G. Lias and Joel F. Liebman
LBLHLM - Sharon G. Lias, John E. Bartmess, Joel F. Liebman, John L. Holmes, Rhoda D. Levin, and W. Gary Mallard
LLK - Sharon G. Lias, Rhoda D. Levin, and Sherif A. Kafafi
RDSH - Henry M. Rosenstock, Keith Draxl, Bruce W. Steiner, and John T. Herron

Quantity Value Units Method Reference Comment
IE (evaluated)15.24 ± 0.14eVN/AN/AL
Quantity Value Units Method Reference Comment
Proton affinity (review)502.9kJ/molN/AHunter and Lias, 1998HL
Quantity Value Units Method Reference Comment
Gas basicity476.6kJ/molN/AHunter and Lias, 1998HL
Quantity Value Units Method Reference Comment
Deltaf(+) ion-134. ± 7.1kJ/molN/AN/A 

Proton affinity at 298K

Proton affinity (kJ/mol) Reference Comment
492.0 ± 8.4Ling, Milburn, et al., 1999T = 298K; MM
492.9 ± 8.4Ling, Milburn, et al., 1999T = 298K; MM

Gas basicity at 298K

Gas basicity (review) (kJ/mol) Reference Comment
465.7 ± 8.4Ling, Milburn, et al., 1999T = 298K; MM
466.5 ± 8.4Ling, Milburn, et al., 1999T = 298K; MM

Protonation entropy at 298K

Protonation entropy (J/mol*K) Reference Comment
21.Ling, Milburn, et al., 1999T = 298K; MM
21.Ling, Milburn, et al., 1999T = 298K; MM

Ionization energy determinations

IE (eV) Method Reference Comment
15.29 ± 0.08ENDKickel, Fisher, et al., 1993LL
15.19PIMurphy and Beauchamp, 1977LLK
15. ± 1.EIFarber and Srivastava, 1977LLK
15.7PELloyd and Roberts, 1975LLK
15.81 ± 0.02PEBassett and Lloyd, 1971LLK
15.92PEBull, Pullen, et al., 1970RDSH
15.7 ± 0.1EIMcDonald, Williams, et al., 1968RDSH
16.4PEBieri, Asbrink, et al., 1982Vertical value; LBLHLM
16.5PELloyd and Roberts, 1975Vertical value; LLK
16.45PEFehlner and Turner, 1974Vertical value; LLK
16.46 ± 0.04PEJonas, Schweitzer, et al., 1973Vertical value; LLK

Appearance energy determinations

Ion AE (eV) Other Products MethodReferenceComment
SiF+28.8 ± 0.1?EIMcDonald, Williams, et al., 1968RDSH
SiF2+27.4 ± 0.1?EIMcDonald, Williams, et al., 1968RDSH
F3Si+16.21 ± 0.18FEND/DERKickel, Fisher, et al., 1993LL
SiF3+16.2 ± 0.1F?EIMcDonald, Williams, et al., 1968RDSH

References

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Hunter and Lias, 1998
Hunter, E.P.; Lias, S.G., Evaluated Gas Phase Basicities and Proton Affinities of Molecules: An Update, J. Phys. Chem. Ref. Data, 1998, 27, 3, 413-656, https://doi.org/10.1063/1.556018 . [all data]

Ling, Milburn, et al., 1999
Ling, Y.; Milburn, R.K.; Hopkinson, A.C.; Bohme, D.K., Experimental and theoretical studies of the proton affinity of SiF4 and the structure of SiF4H+, J. Am. Soc. Mass Spectrom., 1999, 10, 848. [all data]

Kickel, Fisher, et al., 1993
Kickel, B.L.; Fisher, E.R.; Armentrout, P.B., Dissociative charge-transfer reactions of N+(3P), N2+(2g+), Ar+(2P3/2,1/2), and Kr+(2P3/2) with SiF4. Thermochemistry of SiF4+ and SiF3+, J. Phys. Chem., 1993, 97, 10198. [all data]

Murphy and Beauchamp, 1977
Murphy, M.K.; Beauchamp, J.L., Photoionization mass spectrometry of the fluoromethylsilanes (CH3)n F4-nSi (n = 1-4), J. Am. Chem. Soc., 1977, 99, 2085. [all data]

Farber and Srivastava, 1977
Farber, M.; Srivastava, R.D., Mass spectrometric determination of the heats of formation of the silane fluorides, Chem. Phys. Lett., 1977, 51, 307. [all data]

Lloyd and Roberts, 1975
Lloyd, D.R.; Roberts, P.J., Photoelectron spectra of halides. VII. Variable temperature He(I) and He(II) studies of CF4, SiF4, and GeF4, J. Electron Spectrosc. Relat. Phenom., 1975, 7, 325. [all data]

Bassett and Lloyd, 1971
Bassett, P.J.; Lloyd, D.R., Photoelectron spectra of halides. Part I. Tetrafluorides and tetrachlorides of group IVB, J. Chem. Soc., 1971, (A), 641. [all data]

Bull, Pullen, et al., 1970
Bull, W.E.; Pullen, B.P.; Grimm, F.A.; Moddeman, W.E.; Schweitzer, G.K.; Carlson, T.A., High resolution photoelectron spectroscopy of carbon and silicon tetrafluorides, Inorg. Chem., 1970, 9, 2474. [all data]

McDonald, Williams, et al., 1968
McDonald, J.D.; Williams, C.H.; Thompson, J.C.; Margrave, J.L., Appearance potentials, ionization potentials and heats of formation for perfluorosilanes and perfluoroborosilanes, Advan. Chem. Ser., 1968, 72, 261. [all data]

Bieri, Asbrink, et al., 1982
Bieri, G.; Asbrink, L.; Von Niessen, W., 30.4-nm He(II) photoelectron spectra of organic molecules, J. Electron Spectrosc. Relat. Phenom., 1982, 27, 129. [all data]

Fehlner and Turner, 1974
Fehlner, T.P.; Turner, D.W., The photoelectron spectrum of SiF2, Inorg. Chem., 1974, 13, 754. [all data]

Jonas, Schweitzer, et al., 1973
Jonas, A.E.; Schweitzer, G.K.; Grimm, F.A.; Carlson, T.A., The photoelectron spectra of the tetrafluoro and tetramethyl compounds of the group IV elements, J. Electron Spectrosc. Relat. Phenom., 1973, 1, 29. [all data]


Notes

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