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Nonane, 4-methyl-

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Van Den Dool and Kratz RI, non-polar column, temperature ramp

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data compiled by: NIST Mass Spectrometry Data Center, William E. Wallace, director

Column type CapillaryCapillaryCapillaryCapillaryCapillary
Active phase Petrocol DHDB-5OV-101Cross-Linked MethylsiliconeUltra-1
Column length (m) 50.30.80. 50.
Carrier gas HeHeN2 He
Substrate      
Column diameter (mm) 0.250.250.22 0.2
Phase thickness (mum) 0.51.  0.33
Tstart (C) 35.50.30.40.0.
Tend (C) 200.200.130.300.240.
Heat rate (K/min) 3.2.51.5.2.
Initial hold (min) 10.    
Final hold (min) 10.    
I 963.8962.1961.6962.963.54
ReferenceCensullo, Jones, et al., 2003Xu, van Stee, et al., 2003Yin, Liu, et al., 2001Khorasheh, Gray, et al., 1989Steward and Pitzer, 1988
Comment MSDC-RI MSDC-RI MSDC-RI MSDC-RI MSDC-RI
Column type CapillaryCapillaryCapillaryCapillaryCapillary
Active phase Ultra-1Ultra-1Ultra-1Ultra-2Ultra-2
Column length (m) 50.50.50.50.50.
Carrier gas HeHeHeHeHe
Substrate      
Column diameter (mm) 0.220.220.220.220.22
Phase thickness (mum) 0.330.330.330.330.33
Tstart (C) -30.-30.-30.-30.-30.
Tend (C) 240.240.240.240.240.
Heat rate (K/min) 1.2.3.1.2.
Initial hold (min)      
Final hold (min)      
I 963.12963.33963.34962.48962.63
ReferenceHaynes and Pitzer, 1985Haynes and Pitzer, 1985Haynes and Pitzer, 1985Haynes and Pitzer, 1985Haynes and Pitzer, 1985
Comment MSDC-RI MSDC-RI MSDC-RI MSDC-RI MSDC-RI
Column type CapillaryCapillary
Active phase Ultra-2OV-101
Column length (m) 50.108.
Carrier gas He 
Substrate   
Column diameter (mm) 0.220.25
Phase thickness (mum) 0.330.2
Tstart (C) -30.35.
Tend (C) 240.200.
Heat rate (K/min) 3.1.
Initial hold (min)   
Final hold (min)   
I 962.67955.
ReferenceHaynes and Pitzer, 1985Hayes and Pitzer, 1981
Comment MSDC-RI MSDC-RI

References

Go To: Top, Van Den Dool and Kratz RI, non-polar column, temperature ramp, Notes

Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Censullo, Jones, et al., 2003
Censullo, A.C.; Jones, D.R.; Wills, M.T., Speciation of the volatile organic compounds (VOCs) in solventborne aerosol coatings by solid phase microextraction-gas chromatography, J. Coat. Technol., 2003, 75, 936, 47-53, https://doi.org/10.1007/BF02697922 . [all data]

Xu, van Stee, et al., 2003
Xu, X.; van Stee, L.L.P.; Williams, J.; Beens, J.; Adahchour, M.; Vreuls, R.J.J.; Brinkman, U.A.Th.; Lelieveld, J., Comprehensive two-dimensional gas chromatography (GC×GC) measurements of volatile organic compounds in the atmosphere, Atmos. Chem. Phys., 2003, 3, 3, 665-682, https://doi.org/10.5194/acp-3-665-2003 . [all data]

Yin, Liu, et al., 2001
Yin, C.; Liu, W.; Li, Z.; Pan, Z.; Lin, T.; Zhang, M., Chemometrics to chemical modeling: structural coding in hydrocarbons and retention indices of gas chromatography, J. Sep. Sci., 2001, 24, 3, 213-220, https://doi.org/10.1002/1615-9314(20010301)24:3<213::AID-JSSC213>3.0.CO;2-4 . [all data]

Khorasheh, Gray, et al., 1989
Khorasheh, F.; Gray, M.R.; Selucky, M.L., Correlation for Kováts retention index of C9-C26 monoalkyl and polymethyl alkanes and alkenes, J. Chromatogr., 1989, 481, 1-16, https://doi.org/10.1016/S0021-9673(01)96747-0 . [all data]

Steward and Pitzer, 1988
Steward, E.M.; Pitzer, E.W., Gas Chromatographic Analyses of Complex Hydrocarbon Mixtures Void of n-Paraffin Retention Index Markers Using Joint Mass Spectral and Retention Index Libraries, J. Chromatogr. Sci., 1988, 26, 5, 218-222, https://doi.org/10.1093/chromsci/26.5.218 . [all data]

Haynes and Pitzer, 1985
Haynes, P.C., Jr.; Pitzer, E.W., Disengaging solutes in shale- and petroleum-derived jet fuels by altering GC programmed temperature rates, J. Hi. Res. Chromatogr. Chromatogr. Comm., 1985, 8, 5, 230-242, https://doi.org/10.1002/jhrc.1240080504 . [all data]

Hayes and Pitzer, 1981
Hayes, P.C., Jr.; Pitzer, E.W., Kovats indices as a tool in characterizing hydrocarbon fuels in temperature programmed glass capillary gas chromatography. Part 1. Qualitative identification, Inhouse rpt. for Air Force Wright Aeronautical Labs., Air Force Wright Aeronautical Labs., Wright-Patterson AFB, Ohio, 1981, 75. [all data]


Notes

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