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Si8


Gas phase ion energetics data

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data compiled by: John E. Bartmess

Electron affinity determinations

EA (eV) Method Reference Comment
2.30 ± 0.20LPESOhara, Koyasu, et al., 2003 
2.36 ± 0.10LPESKawamata, Neigishi, et al., 1996Vertical Detachment Energy: 2.6640±0.06 eV.
1.95 ± 0.25LPESNakajima, Taguwa, et al., 1995Vertical Detachment Energy: 2.55±0.15 eV.
2.09 ± 0.15LPESKishi, Kawamata, et al., 1997Vertical Detachment Energy: 2.34±.06 eV
2.30 ± 0.20LPESCheshnovsky, Yang, et al., 1987EA given is Vertical Detachment Energy. Adiabatic EA est as up to 1 eV smaller
<2.33997LPDLiu, Zhang, et al., 1986 

References

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Ohara, Koyasu, et al., 2003
Ohara, M.; Koyasu, K.; Nakajima, A.; Kaya, K., Geometric and Electronic Structures of metal (M)-Doped Silicon Clusters (M=Ti, Hf, Mo, and W), Chem. Phys. Lett., 2003, 371, 3-4, 490-497., https://doi.org/10.1016/S0009-2614(03)00299-9 . [all data]

Kawamata, Neigishi, et al., 1996
Kawamata, H.; Neigishi, Y.; Kishi, R.; Iwata, S.; Nakajima, A.; Kaya, K., Photoelectron Spectroscopy of Silicon-Fluorine Binary Cluster Anions (SinFm-), J. Chem. Phys., 1996, 105, 13, 5369, https://doi.org/10.1063/1.472377 . [all data]

Nakajima, Taguwa, et al., 1995
Nakajima, A.; Taguwa, T.; Nakao, K.; Gomei, M.; Kishi, R.; Iwata, S.; Kaya, K., Photoelectron Spectroscopy of silicon-carbon cluster Anions (SinCm-), J. Chem. Phys., 1995, 103, 6, 2050, https://doi.org/10.1063/1.469731 . [all data]

Kishi, Kawamata, et al., 1997
Kishi, R.; Kawamata, H.; Neigishi, Y.; Iwata, S.; Nakajima, A.; Kaya, K., Geometric and Electronic Structures of Silicon-Sodium Binary Clusters. II. Photoelectron Spectroscopy of SinNam Cluster Anions, J. Chem. Phys., 1997, 107, 23, 10029, https://doi.org/10.1063/1.474160 . [all data]

Cheshnovsky, Yang, et al., 1987
Cheshnovsky, O.; Yang, S.H.; Pettiette, C.L.; Craycraft, M.J.; Liu, Y.; Smalley, R.E., Ultraviolet Photoelectron Spectroscopy of Semiconductor Clusters: Silicon and Germanium, Chem. Phys. Lett., 1987, 138, 2-3, 119, https://doi.org/10.1016/0009-2614(87)80353-6 . [all data]

Liu, Zhang, et al., 1986
Liu, Y.; Zhang, Q.-L.; Tittel, F.K.; Curl, R.F.; Smalley, R.E., Photodetachment and Photofragmentation Studies of Semiconductor Cluster Anions, J. Chem. Phys., 1986, 85, 12, 7434, https://doi.org/10.1063/1.451332 . [all data]


Notes

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