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Si2F radical


Gas phase ion energetics data

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data compiled by: John E. Bartmess

Electron affinity determinations

EA (eV) Method Reference Comment
2.430 ± 0.020LPESKishi, Negishi, et al., 1998 
1.99 ± 0.28LPESKawamata, Neigishi, et al., 1996Vertical Detachment Energy: 2.44±0.04 eV

References

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Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Kishi, Negishi, et al., 1998
Kishi, R.; Negishi, Y.; Kawamata, H.; Iwata, S.; Nakajima, A.; Kaya, K., Geometric and electronic structures of fluorine bound silicon clusters, J. Chem. Phys., 1998, 108, 19, 8039-8058, https://doi.org/10.1063/1.475343 . [all data]

Kawamata, Neigishi, et al., 1996
Kawamata, H.; Neigishi, Y.; Kishi, R.; Iwata, S.; Nakajima, A.; Kaya, K., Photoelectron Spectroscopy of Silicon-Fluorine Binary Cluster Anions (SinFm-), J. Chem. Phys., 1996, 105, 13, 5369, https://doi.org/10.1063/1.472377 . [all data]


Notes

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