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Author:Stankiewicz, M.

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4 matching references were found.

Creasey, J.C.; Lambert, I.R.; Tuckett, R.P.; Codling, K.; Leszek, J.F.; Hatherly, P.A.; Stankiewicz, M., Photoionization mass-spectrometric study of fragmentation of SiBr4 and GeBr4 in the range 400-1220 A, J. Chem. Soc. Faraday Trans., 1991, 87, 3717. [all data]

Biehl, H.; Boyle, K.J.; Smith, D.M.; Tuckett, R.P.; Yoxall, K.R.; Codling, K.; Hatherly, P.A.; Stankiewicz, M., J. Chem. Soc., 1996, Faraday Trans. 92, 185. [all data]

Creasey, J.C.; Lambert, I.R.; Tuckett, R.P.; Codling, K.; Fransinski, L.J.; Hatherly, P.A.; Stankiewicz, M., J. Chem. Soc., 1991, Faraday Trans. 87, 1287. [all data]

Smith, D.M.; Tuckett, R.P.; Yoxall, K.R.; Codling, K.; Hatherly, P.A.; Aarts, J.F.M.; Stankiewicz, M., Use of threshold electron and fluorescence coincidence techniques to probe the decay dynamics of the valence states of CF+4, SiF+4, SiCl+4, and GeCl+4, J. Chem. Phys., 1994, 101, 12, 10559, https://doi.org/10.1063/1.467873 . [all data]