Search Results
Search criteria:
| Author: | Seccombe, D.P. |
You may also wish to search for items by Seccombe, D. and Seccombe.
4 matching references were found.
Biehl, H.; Boyle, K.J.; Seccombe, D.P.; Smith, D.M.; Tuckett, R.P.; Yoxall, K.R.; Baumgartel, H.; Jochims, H.W., Vacuum-UV fluorescence spectroscopy of SiF[sub 4] in the range 10--30 eV, J. Chem. Phys., 1997, 107, 3, 720, https://doi.org/10.1063/1.474437 . [all data]
Biehl, H.; Boule, K.J.; Seccombe, D.P.; Tuckett, R.P.; Baumgartel, H.; Jochims, H.W., Vacuum-UV fluorescence spectroscopy of PF[sub 3] in the range 9--20 eV, J. Chem. Phys., 1998, 108, 3, 857, https://doi.org/10.1063/1.475449 . [all data]
Biehl, H.; Boyle, K.I.; Seccombe, D.P.; Smith, D.M.; Tuckett, R.P.; Baumgartel, H.; Jochims, H.W., Vacuum--UV fluorescence spectroscopy of CCl4, SiCl4 and GeCl4 in the range 9--25eV, J. Electron Spectrosc. Relat. Phenom., 1998, 97, 1-2, 89, https://doi.org/10.1016/S0368-2048(98)00261-8 . [all data]
Boyle, K.J.; Seccombe, D.P.; Tuckett, R.P.; Baumgartel, H.; Jochims, H.W., Vacuum--UV fluorescence spectroscopy of GeF4 in the 10--25 eV range, Chem. Phys. Lett., 1998, 294, 6, 507, https://doi.org/10.1016/S0009-2614(98)00881-1 . [all data]
© 2026 by the U.S. Secretary of Commerce on behalf of the United States of America. All rights reserved.
Copyright for NIST Standard Reference Data is governed by the Standard Reference Data Act.