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Yates, B.W.; Tan, K.H.; Bancroft, G.M.; Coatsworth, L.L.; Tse, J.S.; Schrobilgen, G.J., Photoelectron study of the valence level cross sections of XeF2 from 21 to 50 eV photon energy, J. Chem. Phys., 1986, 84, 7, 3603, https://doi.org/10.1063/1.450196 . [all data]