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Author:Raghunathan, V.S.

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6 matching references were found.

Arockiasamy, S.; Mallika, C.; Sreetharan, O.M.; Raghunathan, V.S.; Nagaraja, K.S., Precursor development, characterisation and evaluation of sublimation enthalpies of novel volatile complexes of nickel, Inorganica Chimica Acta, 2009, 362, 6, 1977-1983, https://doi.org/10.1016/j.ica.2008.09.023 . [all data]

Jeevan, T.S. Arul; Arockiasamy, S.; Mathews, Tom; Raghunathan, V.S.; Nagaraja, K.S., Evaluation of enthalpy of sublimation of Zr(tmhd)4 by using thermogravimetric transpiration method, Materials Letters, 2008, 62, 25, 4170-4172, https://doi.org/10.1016/j.matlet.2008.06.033 . [all data]

Maria, Mathew; Selvakumar, J.; Raghunathan, V.S.; Nagaraja, K.S., Role of thermal stability and vapor pressure of bis(2,2,6,6-tetramethyl-3,5-heptanedionato)magnesium(II) and its triamine adduct in producing magnesium oxide thin film using a plasma-assisted LICVD process, Surface and Coatings Technology, 2009, 204, 1-2, 222-227, https://doi.org/10.1016/j.surfcoat.2009.07.022 . [all data]

Jeevan, T.S. Arul; Mathews, Tom; Raghunathan, V.S.; Nagaraja, K.S., Vapor pressure of tetrakis(1,1,1-trifluro-5,6-dimethylheptanedionato)zirconium(IV) and dichlorobis(«eta»5-cyclopentadienyl)zirconium(IV) by TG-based transpiration technique, Thermochimica Acta, 2008, 478, 1-2, 41-44, https://doi.org/10.1016/j.tca.2008.08.010 . [all data]

Maria, Mathew; Selvakumar, J.; Raghunathan, V.S.; Mathews, Tom; Nagaraja, K.S., Temperature dependence vapour pressure measurements of Mg(tmhd)2(tmeda) [(tmhd=2,2,6,6-tetramethyl-3,5-heptanedione, tmeda=N,N,N´,N´-tetramethylethylenediamine], Thermochimica Acta, 2008, 474, 1-2, 87-90, https://doi.org/10.1016/j.tca.2008.04.020 . [all data]

Pankajavalli, R.; Mallika, C.; Sreedharan, O.M.; Raghunathan, V.S.; Antony Premkumar, P.; Nagaraja, K.S., Thermal stability of organo-chromium or chromium organic complexes and vapor pressure measurements on tris(2,4-pentanedionato)chromium(III) and hexacarbonyl chromium(0) by TG-based transpiration method, Chemical Engineering Science, 2002, 57, 17, 3603-3610, https://doi.org/10.1016/S0009-2509(02)00248-8 . [all data]