Search Results
Search criteria:
| Author: | Hudgens, J.W. |
You may also wish to search for items by Hudgens, J. and Hudgens.
39 matching references were found.
Johnson III, R.D.; Tsai, B.P.; Hudgens, J.W., Multiphoton ionization of SiH3 and SID3 radicals: Electronic spectra, vibrational analyses of the ground and Rydberg states, and ionization potentials, J. Chem. Phys., 1989, 91, 3340. [all data]
Hudgens, J.W.; Johnson, R.D., III; Tsai, B.P.; Kafafi, S.A., Experimental and ab initio studies of electronic structures of the CCl3 radical and cation, J. Am. Chem. Soc., 1990, 112, 5763. [all data]
Hudgens, J.W.; Johnson, R.D.; Timonen, S.; Seetula, J.A.; Seetula, J.A.; Gutman, D., Kinetics of the reaction Br2 + CCl3, and the thermochemistry of the CCl3 radical and cation, J. Phys. Chem., 1991, 95, 4400. [all data]
Hudgens, J.W.; Johnson, R.D.; Tsai, B.P., New electronic spectra of the CHFCl radical observed with resonance enhanced multiphoton ionization, J. Chem. Phys., 1993, 98, 1925. [all data]
Irikura, K.K.; Hudgens, J.W.; Johnson, R.D., III, Spectroscopy of the fluoromethylene radicals HCF and DCF by 2+1 resonance enhanced multiphoton ionization spectroscopy and by ab initio calculation, J. Chem. Phys., 1995, 103, 1303. [all data]
Johnson, R.D., III; Hudgens, J.W., Structural and thermochemical properties of hydroxymethyl (CH2OH) radicals and cations derived from observations of B 2A'(3p)←X 2A" electronic spectra and from ab initio calculations, J. Phys. Chem., 1996, 100, 19874. [all data]
Hudgens, J.W.; Johnson, R.D., III; Timonen, R.S.; Seetula, J.A.; Gutman, D., Kinetics of the reaction of CCl3 + Br2 and thermochemistry of CCl3 radical and cation, J. Phys. Chem., 1991, 95, 4400-4405. [all data]
Atkinson, D.B.; Hudgens, J.W., Rate Coefficients for the Propargyl Radical Self-Reaction and Oxygen Addition Reaction Measured Using Ultraviolet Cavity Ring-down Spectroscopy, J. Phys. Chem. A, 1999, 103, 21, 4242, https://doi.org/10.1021/jp990468s . [all data]
Atkinson, D.B.; Irikura, K.K.; Hudgens, J.W., Electronic Structure of the BF, J. Phys. Chem. A, 1997, 101, 11, 2045, https://doi.org/10.1021/jp9623251 . [all data]
Brum, J.L.; Hudgens, J.W., Multiphoton Ionization Spectroscopy of PCl2 Radicals: Observation of Two New Rydberg States, J. Phys. Chem., 1994, 98, 22, 5587, https://doi.org/10.1021/j100073a001 . [all data]
Brum, J.L.; Hudgens, J.W., Spectroscopic characterization of the AsF2 radical, J. Chem. Phys., 1997, 106, 2, https://doi.org/10.1063/1.473389 . [all data]
Brum, J.L.; Johnson, R.D., III; Hudgens, J.W., Electronic Spectrum of the .alpha.,.alpha.-Difluoroethyl Radical, J. Phys. Chem., 1994, 98, 14, 3645, https://doi.org/10.1021/j100065a017 . [all data]
Dulcey, C.S.; Hudgens, J.W., Multiphoton ionization spectroscopy and vibrational analysis of a 3p Rydberg state of the hydroxymethyl radical, J. Chem. Phys., 1986, 84, 10, 5262, https://doi.org/10.1063/1.449935 . [all data]
Dearden, D.V.; Hudgens, J.W.; Johnson, R.D., III; Tsai, B.P.; Kafafi, S.A., Spectroscopic and ab initio studies of difluoromethyl radicals and cations, J. Phys. Chem., 1992, 96, 2, 585, https://doi.org/10.1021/j100181a017 . [all data]
DiGiuseppe, T.G.; Hudgens, J.W.; Lin, M.C., Multiphoton ionization of methyl radicals in the gas phase, J. Phys. Chem., 1982, 86, 1, 36, https://doi.org/10.1021/j100390a008 . [all data]
Duignan, M.T.; Hudgens, J.W.; Wyatt, J.R., Multiphoton ionization of the trifluoromethyl radical, J. Phys. Chem., 1982, 86, 21, 4156, https://doi.org/10.1021/j100218a013 . [all data]
Howe, J.D.; Ashfold, M.N.R.; Hudgens, J.W.; Johnson, R.D., III, Observation of the PF2 radical by resonance enhanced multiphoton ionization spectroscopy, J. Chem. Phys., 1994, 101, 5, 3549, https://doi.org/10.1063/1.468429 . [all data]
Hudgens, J.W.; Dulcey, C.S., Observation of the 3s 2A1 Rydberg states of allyl and 2-methylallyl radicals with multiphoton ionization spectroscopy, J. Phys. Chem., 1985, 89, 8, 1505, https://doi.org/10.1021/j100254a039 . [all data]
Hudgens, J.W.; DiGiuseppe, T.G.; Lin, M.C., Two photon resonance enhanced multiphoton ionization spectroscopy and state assignments of the methyl radical, J. Chem. Phys., 1983, 79, 2, 571, https://doi.org/10.1063/1.445857 . [all data]
Hudgens, J.W.; Dulcey, C.S.; Long, G.R.; Bogan, D.J., Multiphoton ionization spectra of radical products in the F(2P)+ketene system: Spectral assignments and formation reaction for CH2F, observation of CF and CH, J. Chem. Phys., 1987, 87, 8, 4546, https://doi.org/10.1063/1.452867 . [all data]
Hoffbauer, M.A.; Hudgens, J.W., Multiphoton ionization detection of gas-phase benzyl radicals, J. Phys. Chem., 1985, 89, 24, 5152, https://doi.org/10.1021/j100270a005 . [all data]
Irikura, K.K.; Hudgens, J.W., Detection of methylene (~X 3B1) radicals by 3 + 1 resonance-enhanced multiphoton ionization spectroscopy, J. Phys. Chem., 1992, 96, 2, 518, https://doi.org/10.1021/j100181a006 . [all data]
Irikura, K.K.; Johnson, R.D., III; Hudgens, J.W., Two new electronic states of methylene, J. Phys. Chem., 1992, 96, 15, 6131, https://doi.org/10.1021/j100194a010 . [all data]
Irikura, K.K.; Johnson, R.D., III; Hudgens, J.W., Electronic spectrum of the trichlorosilyl radical, J. Phys. Chem., 1992, 96, 11, 4306, https://doi.org/10.1021/j100190a038 . [all data]
Johnson, R.D., III; Hudgens, J.W., A new eletronic spectrum of the SiH3 radical observed using multiphoton ionization spectroscopy, Chem. Phys. Lett., 1987, 141, 3, 163, https://doi.org/10.1016/0009-2614(87)85002-9 . [all data]
Johnson, R.D., III; Hudgens, J.W., Electronic spectra of sulfur difluoride radicals between 295 and 495 nm observed with resonance-enhanced multiphoton ionization spectroscopy, J. Phys. Chem., 1990, 94, 8, 3273, https://doi.org/10.1021/j100371a011 . [all data]
Johnson, R.D., III; Hudgens, J.W., Multiphoton ionization of SiH3 and SiD3 radicals. II. Three-photon resonance-enhanced spectra observed between 450 and 610 nm, J. Chem. Phys., 1991, 94, 8, 5331, https://doi.org/10.1063/1.460518 . [all data]
Johnson, R.D., III; Hudgens, J.W.; Ashfold, M.N.R., Excited electronic states of the SiF2 radical studied by resonance enhanced multiphoton ionisation spectroscopy and by ab initio methods, Chem. Phys. Lett., 1996, 261, 4-5, 474, https://doi.org/10.1016/0009-2614(96)00990-6 . [all data]
Johnson, R.D., III; Tsai, B.P.; Hudgens, J.W., The electronic spectrum of the GeH3 radical, J. Chem. Phys., 1988, 89, 8, 4558, https://doi.org/10.1063/1.454796 . [all data]
Long, G.R.; Hudgens, J.W., Resonance enhanced multiphoton ionization spectroscopy of dichloromethyl and dichloromethyl-d radicals, J. Phys. Chem., 1987, 91, 23, 5870, https://doi.org/10.1021/j100307a011 . [all data]
Tsai, B.P.; Johnson, R.D., III; Hudgens, J.W., Electronic spectra of chlorodifluoromethyl and dichlorofluoromethyl radicals observed by resonance-enhanced multiphoton ionization, J. Phys. Chem., 1989, 93, 14, 5334, https://doi.org/10.1021/j100351a004 . [all data]
Duignan, M.T.; Hudgens, J.W., Multiphoton ionization spectroscopy of ClO and BrO, J. Chem. Phys., 1985, 82, 4426-4433. [all data]
Dulcey, C.S.; Hudgens, J.W., Detection of SiF radicals with multiphoton ionization spectroscopy, Chem. Phys. Lett., 1985, 118, 444-447. [all data]
Johnson, R.D., III; Long, G.R.; Hudgens, J.W., Two photon resonance enhanced multiphoton ionization spectroscopy of gas phase O2a1Δg between 305-350 nm, J. Chem. Phys., 1987, 87, 1977-1981. [all data]
Johnson, R.D., III; Tsai, B.P.; Hudgens, J.W., Resonance enhanced multiphoton ionization spectra of the GeF and GeCl radicals from 400 to 500 nm, J. Chem. Phys., 1988, 89, 6064-6068. [all data]
Johnson, R.D., III; Hudgens, J.W., New electronic state of SiH and SiD radicals observed by resonance-enhanced multiphoton ionization spectroscopy, J. Phys. Chem., 1989, 93, 6268-6270. [all data]
Dearden, D.V.; Johnson, R.D., III; Hudgens, J.W., New Rydberg states of aluminum monofluoride observed by resonance-enhanced multiphoton ionization spectroscopy, J. Phys. Chem., 1991, 95, 4291-4296. [all data]
Kafafi, S.A.; Hudgens, J.W., Abinitio calc of str. and freq for chcl2, J. Phys. Chem., 1989, 93, 3474. [all data]
Hudgens, J.W.; Dulcey, C.S., J. Phys. Chem., 1985, 89, 1505-9. [all data]
© 2026 by the U.S. Secretary of Commerce on behalf of the United States of America. All rights reserved.
Copyright for NIST Standard Reference Data is governed by the Standard Reference Data Act.