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Author:Drag, C.

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6 matching references were found.

Blondel, C.; Chaibi, W.; Delsart, C.; Drag, C.; Goldfarb, F.; Kroger, S., The electron affinities of O, Si, and S revisited with the photodetachment microscope, Eur. Phys. J. D, 2005, 33, 3, 335-342, https://doi.org/10.1140/epjd/e2005-00069-9 . [all data]

Chaibi, W.; Delsart, C.; Drag, C.; Blondel, C., High precision measurement of the (SH)-S-32 electron affinity by laser detachment microscopy, J. Molec. Spectros., 2006, 239, 1, 11-15, https://doi.org/10.1016/j.jms.2006.05.012 . [all data]

Pelaez, R.J.; Blondel, C.; Delsart, C.; Drag, C., Pulsed photodetachment microscopy and the electron affinity of iodine, J. Phys. B: Atom. Mol. Opt. Phys., 2009, 42, 12, 125001, https://doi.org/10.1088/0953-4075/42/12/125001 . [all data]

Pelaez, R.J.; Blondel, C.; Vandevraye, M.; Drag, C.; Delsart, C., Photodetachment microscopy to an excited spectral term and the electron affinity of phosphorus, J. Phys. B: Atom. Mol. Opt. Phys., 2011, 44, 19, 195009, https://doi.org/10.1088/0953-4075/44/19/195009 . [all data]

Vandevraye, M.; Drag, C.; Blondel, C., Electron affinity of tin measured by photodetachment microscopy, J. Phys. B: Atom. Mol. Opt. Phys., 2013, 46, 12, 125002, https://doi.org/10.1088/0953-4075/46/12/125002 . [all data]

Vandevraye, M.; Drag, C.; Blondel, C., Electron affinity of selenium measured by photodetachment microscopy, Phys. Rev. A, 2012, 85, 1, 015401, https://doi.org/10.1103/PhysRevA.85.015401 . [all data]