Tetraethyl silicate

• Formula: C₈H₂₀O₄Si
• Molecular weight: 208.3275
• IUPAC Standard InChI: InChI=1S/C8H20O4Si/c1-5-9-13(10-6-2,11-7-3)12-8-4/h5-8H2,1-4H3 Copy

  
• IUPAC Standard InChIKey: BOTDANWDWHJENH-UHFFFAOYSA-N Copy
• CAS Registry Number: 78-10-4
• Chemical structure:
  This structure is also available as a 2d Mol file
• Other names: Silicic acid (H4SiO4), tetraethyl ester; Dynasil A; Ethyl orthosilicate; ES 28 (ester); Silane, tetraethoxy-; Silicon ethoxide; Silicon tetraethoxide; Tetraethoxysilane; Tetraethoxysilicon; Tetraethyl orthosilicate; TEOS; (C2H5O)4Si; Ethyl silicate, ((EtO)4Si); Etylu krzemian; Silicate d'ethyle; Silicate tetraethylique; Silicic acid, tetraethyl ester; Tetraethylsilikat; UN 1292; ES 100; ES 28; NSC 4790; Silikan L
• Permanent link for this species. Use this link for bookmarking this species for future reference.
• Information on this page:
  • Phase change data
  • References
  • Notes
• Other data available:
  • Condensed phase thermochemistry data
  • Gas phase ion energetics data
  • IR Spectrum
  • Mass spectrum (electron ionization)
  • Gas Chromatography
• Data at other public NIST sites:
  • Gas Phase Kinetics Database
• Options:
  • Switch to calorie-based units

Data at NIST subscription sites:

• NIST / TRC Web Thermo Tables, professional edition (thermophysical and thermochemical data)

NIST subscription sites provide data under the NIST Standard Reference Data Program, but require an annual fee to access. The purpose of the fee is to recover costs associated with the development of data collections included in such sites. Your institution may already be a subscriber. Follow the links above to find out more about the data in these sites and their terms of usage.

Phase change data

Go To: Top, References, Notes

Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

Data compiled as indicated in comments:
TRC - Thermodynamics Research Center, NIST Boulder Laboratories, Chris Muzny director
BS - Robert L. Brown and Stephen E. Stein
AC - William E. Acree, Jr., James S. Chickos
CAL - James S. Chickos, William E. Acree, Jr., Joel F. Liebman, Students of Chem 202 (Introduction to the Literature of Chemistry), University of Missouri -- St. Louis
DH - Eugene S. Domalski and Elizabeth D. Hearing

Enthalpy of vaporization

Antoine Equation Parameters

log₁₀(P) = A − (B / (T + C))
    P = vapor pressure (bar)
    T = temperature (K)

View plot Requires a JavaScript / HTML 5 canvas capable browser.

Enthalpy of fusion

Entropy of fusion

Enthalpy of phase transition

Entropy of phase transition

References

Go To: Top, Phase change data, Notes

Data compilation copyright by the U.S. Secretary of Commerce on behalf of the U.S.A. All rights reserved.

vanderVis, Konings, et al., 1992
vanderVis, M.G.M.; Konings, R.J.M.; Oskam, A.; Snoeck, T.L., The vibrational spectra of gaseous and liquid tetraethoxysilane, J. Mol. Struct., 1992, 274, 47-57. [all data]

PCR Inc., 1990
PCR Inc., Research Chemicals Catalog 1990-1991, PCR Inc., Gainesville, FL, 1990, 1. [all data]

Lecat, 1943
Lecat, M., Azeotropes of Ethyl Urethane and other Azeotropes, C. R. Hebd. Seances Acad. Sci., 1943, 217, 273. [all data]

Solana and Moles, 1932
Solana, L.; Moles, E., Preparation and properties of ethyl orthosilicate, An. R. Soc. Esp. Fis. Quim., 1932, 30, 886-917. [all data]

van der Vis and Cordfunke, 1995
van der Vis, M.G.M.; Cordfunke, E.H.P., Tetraethoxysilane, Si(OC2H5)4: vapour pressure measurements at temperatures from 323 to 442 K by means of a Bourdon spoon gauge, Thermochimica Acta, 1995, 265, 129-134, https://doi.org/10.1016/0040-6031(95)02403-O . [all data]

Klyuchnikov, Danilova, et al., 1985
Klyuchnikov, V.A.; Danilova, T.F.; Voronkov, M.G.; D'yakov, V.M., Dokl. Phys. Chem., 1985, 281, 373. [all data]

Thomas, Smith, et al., 2007
Thomas, Leo H.; Smith, Harry; Davies, Gwyn H., Vapour pressures, molar entropies of vaporisation and liquid-state conformation of alkoxides, J. Chem. Technol. Biotechnol., 2007, 30, 1, 476-480, https://doi.org/10.1002/jctb.503300160 . [all data]

Kato and Tanaka, 1989
Kato, Masahiro; Tanaka, Hiroyuki, Ebulliometric measurement of vapor-liquid equilibria for four binary systems: methanol + silicon tetramethoxide, methanol + silicon tetraethoxide, ethanol + silicon tetramethoxide, and ethanol + silicon tetraethoxide, J. Chem. Eng. Data, 1989, 34, 2, 206-209, https://doi.org/10.1021/je00056a018 . [all data]

Stull, 1947
Stull, Daniel R., Vapor Pressure of Pure Substances. Organic and Inorganic Compounds, Ind. Eng. Chem., 1947, 39, 4, 517-540, https://doi.org/10.1021/ie50448a022 . [all data]

Van Der Vis, Cordfunke, et al., 1992
Van Der Vis, M.G.M.; Cordfunke, E.H.P.; Konings, R.J.M.; Van Den Berg, G.J.K.; Van Miltenburg, J.C., Tetraethoxysilane, Si(OC2H5)4: heat capacity and thermodynamic properties at temperatures from 0 to 440 K, The Journal of Chemical Thermodynamics, 1992, 24, 10, 1103-1108, https://doi.org/10.1016/S0021-9614(05)80022-9 . [all data]

Van der Vis, Cordfunke, et al., 1992
Van der Vis, M.G.M.; Cordfunke, E.H.P.; Konings, R.J.M.; Van der Berg, G.J.K.; Van Miltenburg, J.C., Tetraethoxysilane, Si(OC2H5)4: heat capacity and thermodynamic properties at temperatures from 0 to 440 K, J. Chem. Thermodyn., 1992, 24, 10, 1103, https://doi.org/10.1016/S0021-9614(05)80022-9 . [all data]

van der Vis, Cordfunke, et al., 1992
van der Vis, M.G.M.; Cordfunke, E.H.P.; Konings, R.J.M.; van den Berg, G.J.K.; van Miltenburg, J.C., Tetraethoxysilane, Si(OC₂H₅)₄: heat capacity and thermodynamic properties at temperatures from 0 to 440 K, J. Chem. Thermodynam., 1992, 24, 1103-1108. [all data]

Notes

Go To: Top, Phase change data, References

• Symbols used in this document:
  

  Tboil	Boiling point
  Tfus	Fusion (melting) point
  ΔHtrs	Enthalpy of phase transition
  ΔStrs	Entropy of phase transition
  ΔfusH	Enthalpy of fusion
  ΔfusS	Entropy of fusion
  ΔvapH	Enthalpy of vaporization
  ΔvapH°	Enthalpy of vaporization at standard conditions

• Data from NIST Standard Reference Database 69: NIST Chemistry WebBook
• The National Institute of Standards and Technology (NIST) uses its best efforts to deliver a high quality copy of the Database and to verify that the data contained therein have been selected on the basis of sound scientific judgment. However, NIST makes no warranties to that effect, and NIST shall not be liable for any damage that may result from errors or omissions in the Database.
• Customer support for NIST Standard Reference Data products.